CSS 2011 & Seed Expo brings corn, sorghum and soybean experts together
The American Seed Trade Association’s CSS 2011 & Seed Expo, being held December 6-9 in Chicago, Ill., will feature the nation’s top corn, sorghum and soybean seed researchers who will share their latest findings, technology developments and future outlook.
“Opening our Herbicide Toolbox to Improve Yields,” is the first session to kickoff the conference. This session will include an overview of herbicide technologies by Hunt Wiley of Dow AgroSciences and regional perspectives of herbicide resistance and the stewardship ramifications by Tom Eubank of Mississippi State University, Bill Johnson of Purdue University and Jed Colquhoun of the University of Wisconsin-Madison.
“The Corn, Sorghum & Soybean Seed Research Conference is a culmination of researchers and educational sessions, business meetings and a trade show,” says Shawn Conley, chair for the Soybean Seed Research Conference Planning Committee and University of Wisconsin agronomist. “This is where we discuss critical issues or challenges that affect agricultural professionals and growers across the United States and how we might overcome them.”
Also on the conference schedule is Business of the Seed Business, Second-Generation Biofuels, a sorghum session and Efficiencies and Selection of Breeding.
New to the conference, Business of the Seed Business will include discussions on determining the worth of a company, linking research and business strategy, marketing metrics and using social media.
Following Business of the Seed Business, Second Generation Biofuels will include focus on The Root of the Matter by Jonathan Lynch of Pennsylvania State University and Progress of G by E Methodology by Jose Crossa of the International Maize and Wheat Improvement Center.
Topics comprising the sorghum session include National Sorghum Research Checkoff Priorities, End Use Improvements and Genetic Analysis of Cold Tolerance in Sorghum.
Harry Brokish of AgReliant Genetics LLC will start the Efficiencies and Selection of Breeding session with a discussion on Plot Numbers Soar with Today’s Equipment and Technology, which will be followed by Computational Tools for Improving Efficiency of Breeding Programs by Rita Mumm of the University of Illinois. Then Steve Goff will close with The Data Blackhole and how to manage it.
For the complete conference agenda and more information about the speakers, visit amseed.org prior to November 10.
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